Note:You are reading this message because your browser either doesn't support cascading style sheet (CSS) standards or is unable to access our CSS files (perhaps a browser setting). The majority of websites now use CSS to dramatically improve page layout. Virtually all recent browsers support CSS, so why not upgrade to view sites how they were intended to be seen?
ASSET InterTech is the world leader in Manufacturing Test and Hardware Debug Solutions for processor-based boards.
µMaster can be used to extend the test coverage of Boundary Scan Testers (BST or JTAG), In-Circuit Testers (ICT) and Manufacturing Defects Analyzers (MDA).
A summary of how µMaster can extend ICT/MDA and JTAG coverage is shown in the diagram below.
While JTAG testers are becoming one of the preferred methods of structurally testing today's PCBAs, there are still gaps in test coverage because some ICs are not JTAG enabled. Sometimes PCBAs don't implement JTAG, even though the components used on them are JTAG enabled.
JTAG tests the interconnections between ICs and other components - it doesn't test the core logic of the ICs to verify their function. At-speed testing of buses is not possible.
µMaster's e-JTAG testing combines CPU Emulation and JTAG test methods to get the best of both worlds.
µMaster's CPU Emulation is different from JTAG. While it accesses the board via the same JTAG port, it only uses this port to transfer CPU commands and data. µMaster instructs the CPU to set up ICs and test them in a similar way to the board's boot code and device drivers. This allows at-speed testing of buses and ICs, including non-JTAG-enabled devices. µMaster is a perfect compliment to JTAG testers, overcoming any coverage shortfalls. µMaster can also run JTAG tests itself, using SVF format test vector files.
See this page for more details of the benefits of combining µMaster with JTAG testers.
The greatest problem for ICT and MDA testers is the lack of access for bed-of-nails probes to test points on today's PCBAs. Multi-layered boards with hidden VIAs, miniaturized components, and components with concealed contacts, such as BGA's, all cause problems for these testers.
In addition to access problems, the functional testing of complex IC's is impractical due to the vast amount of vectors that need to be injected to fully test the core logic.
µMaster requires only 5-6 test points to access the whole board. The functional testing of complex ICs is also easily carried out by µMaster. Combining µMaster with ICT or MDA testers provides additional benefits, such as at-speed testing of bus terminations and differential buses.
