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ASSET InterTech is the world leader in Manufacturing Test and Hardware Debug Solutions for processor-based boards.
µMaster's e-JTAG combines powerful test approaches:
The µMaster interface automates the complete test and diagnostic process.
In contrast to JTAG / Boundary Scan testing, µMaster's CPU Emulation uses the JTAG port to deliver real test and diagnostic code, which is run at full CPU speed. This includes bus tests, memory tests, and I/O tests. µMaster takes control of the CPU at reset, preventing it from running boot code. It then instructs the CPU to write appropriate test data to each addressable device, sequentially verifying or diagnosing the device and its associated interconnects and buses.
Using CPU Emulation in addition to JTAG allows µMaster to greatly extend test coverage:
µMaster can run JTAG / Boundary Scan tests to verify a board's component interconnections. µMaster supports vector files written in the Serial Vector Format (SVF). This open standard is maintained by ASSET InterTech. A description of the SVF standard is available on their website at the following address:
http://www.asset-intertech.com/support/svf.html
SVF files can be generated by most 3rd party ATPG tools, such as ASSET InterTech's ScanWorks® products. During test execution, both boundary scan and emulation tests can be run as an automated sequence through µMaster.
µMaster communicates with a wide range of I/O test cards, housed in the I/O Emulation Unit’s 16 slot chassis. These cards generate input signals and measure output signals for all types of standard and custom I/O circuits. Closed loop feedback to the Test Controller Card in the host system enables µMaster to compare stimulus with response. Testing is faster than when using real peripheral devices, and far better diagnostics are provided. The full I/O path is tested, right out to external connectors. Available cards include Keyboard, Mouse, IrDA, Serial, Parallel, USB, Firewire (IEEE 1394), Ethernet, SCSI, IDE, SATA, Video, LCD Checker, Audio, Modem, Battery Simulator, Analog I/O, Digital I/O, and a Prototyping Card.
µMaster caters for a wide range of applications, including board development, manufacturing test, manufacturing debug, and field returns debug. For example, the Interactive mode of operation is intended for board development and debug: this mode provides tools for directly modifying and reading device registers and memory locations, without having to program tests. In contrast, the fully-automated Operator mode runs pre-scripted tests, which either supply simple pass/fail results for manufacturing, or comprehensive graphical / textual guidance for board repair.
Board tests are divided into sub-tests for each addressable device on the board. The tests begin at the CPU and work progressively away from the CPU. To see a sample test sequence, go to this page.
To see the µMaster test executive in action, either download our demo, or contact our Sales Team.
